Pubblicazioni
Pubblicazioni su rivista
- V. Vadalà, A. Raffo, S. Di Falco, G. Bosi, A. Nalli, G. Vannini, “A load-pull characterization technique accounting for harmonic tuning,” IEEE Transactions on Microwave Theory and Techniques, vol. 61, no. 7, pp. 2695–2704, Jul. 2013.
- A. Raffo, G. Bosi, V. Vadalà, G. Vannini, “Behavioral modeling of GaN FETs: a load-line approach,” IEEE Transactions on Microwave Theory and Techniques, vol. 62, no. 1, pp. 73–82, Jan. 2014.
- G. Bosi, G. Crupi, V. Vadalà, A. Raffo, A. Giovannelli, G. Vannini. “Nonlinear modeling of LDMOS transistors for high-power FM transmitters,” International Journal of Numerical Modelling: Electronic Networks, Devices and Fields, vol. 27, no. 5–6, pp. 780–791, Sept.-Dec. 2014.
- G. Crupi, A. Raffo, G. Avolio, G. Bosi, G. Sivverini, F. Palomba, A. Caddemi, D. M. M.-P. Schreurs, G. Vannini, “Nonlinear modeling of GaAs pHEMTs for millimeter-wave mixer design,” Solid-State Electronics, vol. 104, pp. 25–32, Feb. 2015.
- A. Raffo, V. Vadalà, G. Bosi, F. Trevisan, G. Avolio, G. Vannini, “Waveform engineering: State-of-the-art and future trends,” International Journal of RF and Microwave Computer-Aided Engineering, vol. 27, no. 1, pp. 1–16, Jan. 2017.
- G. Bosi, A. Raffo, F. Trevisan, V. Vadalà, G. Crupi, G. Vannini, “Nonlinear-embedding design methodology oriented to LDMOS power amplifiers,” IEEE Transactions on Power Electronics, vol. 33, no. 10, pp. 8764–8774, Oct. 2018.
- A. Raffo, G. Avolio, V. Vadalà, G. Bosi, G. Vannini, D. Schreurs, “Assessing GaN FET performance degradation in power amplifiers for pulsed radar systems,” IEEE Microwave and Wireless Components Letters, vol. 28, no. 11, pp. 1035–1037, Nov. 2018.
- A. Petrocchi, A. Raffo, G. Bosi, G. Avolio, D. Resca, G. Vannini, D. Schreurs, “An ultra-wideband sensing board for radio frequency front-end in IoT transmitters,” Electronics, vol. 8, no. 10, p. 1191, Oct. 2019.
- A. Raffo, V. Vadalà, H. Yamamoto, K. Kikuchi, G. Bosi, N. Ui, K. Inoue, G. Vannini, “A new modeling technique for microwave multicell transistors based on EM simulations,” IEEE Transactions on Microwave Theory and Techniques, vol. 68, no. 7, pp. 3100-3110, July 2020.
Pubblicazioni a conferenza
- V. Vadalà, A. Raffo, G. Bosi, G. Crupi, G. Vannini, “Transistor vector load-pull characterization for millimeter-wave power amplifier design,” 79th Microwave Measurement Conference (ARFTG), Montreal, Canada, Jun. 2012, pp. 1–3.
- G. Crupi, A. Raffo, G. Sivverini, G. Bosi, G. Avolio, D. Schreurs, A. Caddemi, G. Vannini, “Non-linear look-up table modeling of GaAs HEMTs for mixer application,” Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits (INMMiC), Dublin, Ireland, Sept. 2012, pp. 1–3.
- V. Vadalà, G. Bosi, A. Raffo, G. Vannini, G. Avolio, D. Schreurs, “Influence of the gate current dynamic behaviour on GaAs HEMT reliability issues,” 7th European Microwave Integrated Circuits Conference (EuMIC), Amsterdam, The Netherlands, Oct. 2012, pp. 258–261.
- G. Bosi, A. Raffo, G. Avolio, V. Vadalà, D. Schreurs, G. Vannini, “Microwave FET model identification based on vector intermodulation measurements,” 2013 IEEE MTT-S International Microwave Symposium Digest, Seattle, WA, USA, Jun. 2013, pp. 1–4.
- A. Nalli, A. Raffo, G. Avolio, V. Vadalà, G. Bosi, D. Schreurs, G. Vannini, “Extremely low-frequency measurements using an active bias tee,” 2013 IEEE MTT-S International Microwave Symposium Digest, Seattle, WA, USA, Jun. 2013, pp. 1–4.
- A. Raffo, V. Vadalà, G. Avolio, G. Bosi, A. Nalli, D. Schreurs, G. Vannini, “Linear versus nonlinear de-embedding: experimental investigation,” 81st ARFTG Microwave Measurement Conference (ARFTG), Seattle, WA, USA, Jun. 2013, pp. 1–5.
- G. Bosi, A. Raffo, V. Vadalà, A. Nalli, G. Vannini, “Identification of the optimum operation for GaN HEMTs in high-power amplifiers,” SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference, Rio de Janeiro, Brasil, Aug. 2013, pp. 1–5.
- G. Bosi, A. Raffo, A. Nalli, V. Vadalà, G. Vannini, “Characterization of charge-trapping effects in GaN FETs through low-frequency measurements,” 2014 International Workshop on Integrated Nonlinear Microwave and Millimetre-wave Circuits (INMMiC), Leuven, Belgium, Apr. 2014, pp. 1–3.
- V. Vadalà, A. Raffo, P. Colantonio, E. Cipriani, F. Giannini, C. Lanzieri, A. Pantellini, A. Nalli, G. Bosi, G. Vannini, “Evaluation of FET performance and restrictions by low-frequency measurements,” 2014 International Workshop on Integrated Nonlinear Microwave and Millimetre-wave Circuits (INMMiC), Leuven, Belgium, Apr. 2014, pp. 1–3.
- Z. Marinković, G. Crupi, A. Raffo, G. Bosi, G. Avolio, V. Marković, A. Caddemi, G. Vannini, D. M. M.-P. Schreurs, “A neural network approach for nonlinear modelling of LDMOSFETs,” 2014 International Workshop on Integrated Nonlinear Microwave and Millimetre-wave Circuits (INMMiC), Leuven, Belgium, Apr. 2014, pp. 1–3.
- G. Bosi, A. Raffo, G. Vannini, E. Cipriani, P. Colantonio, F. Giannini, “Gate waveform effects on high-efficiency PA design: an experimental validation,” 9th European Microwave Integrated Circuit Conference (EuMIC), Rome, Italy, Oct. 2014, pp. 329–332.
- G. Bosi, A. Raffo, V. Vadalà, G. Vannini, “A new description of fast charge-trapping effects in GaN FETs,” 2015 IEEE MTT-S International Microwave Symposium Digest, Phoenix, AZ, USA, May 2015, pp. 1–4.
- E. Cipriani, P. Colantonio, F. Giannini, G. Bosi, A. Raffo, V. Vadalà, G. Vannini, “C-band power amplifier design based on low-frequency waveform engineering,” 10th European Microwave Integrated Circuits Conference (EuMIC), Paris, Sept. 2015, pp. 325–328.
- A. Raffo, P. Colantonio, E. Cipriani, V. Vadalà, G. Bosi, T. M. Martin-Guerrero, G. Vannini, F. Giannini “Theoretical consideration on harmonic manipulated amplifiers based on experimental data,” Integrated Nonlinear Microwave and Millimetre-wave Circuits Workshop (INMMiC), Taormina, Italy, Oct. 2015, pp. 1–3.
- A. Raffo, G. Bosi, V. Vadalà, G. Vannini, “Nonlinear modelling of GaN transistors: Behavioural and analytical approaches,” 12th International Conference on Telecommunication in Modern Satellite, Cable and Broadcasting Services (TELSIKS), Niš (Serbia), Oct. 2015, pp. 83–89.
- G. Bosi, A. Raffo, G. Avolio, D. Schreurs, D. A. Humphreys, “Impact of microwave measurement uncertainty on the nonlinear embedding procedure,” 87th Microwave Measurement Conference (ARFTG), San Francisco, CA, USA, May 2016, pp. 1–4.
- D. A. Humphreys, A. Raffo, G. Bosi, G. Vannini, D. Schreurs, K. N. Gebremicael, “Maximizing the benefit of existing equipment for nonlinear and communication measurements,” 87th Microwave Measurement Conference (ARFTG), San Francisco, CA, USA, May 2016, pp. 1–4.
- G. Formicone, J. Burger, J. Custer, G. Bosi, A. Raffo, G. Vannini, “Solid-state RF power amplifiers for ISM CW applications based on 100 V GaN technology,” 11th European Microwave Integrated Circuits Conference (EuMIC), London, UK, Oct. 2016, pp. 33–36.
- V. Vadalà, A. Raffo, G. Bosi, G. Vannini, P. Colantonio, F. Giannini, “Fast extraction of accurate I/V models for harmonically-tuned power amplifier design,” 11th European Microwave Integrated Circuits Conference (EuMIC), London, UK, Oct. 2016, pp. 285–288.
- G. Bosi, A. Raffo, V. Vadalà, F. Trevisan, G. Vannini, O. Cengiz, O. Sen, E. Ozbay, “Low-frequency time-domain characterization for fast and reliable evaluation of microwave transistor performance,” 11th European Microwave Integrated Circuits Conference (EuMIC), London, UK, Oct. 2016, pp. 41–44.
- G. Formicone, J. Burger, J. Custer, W. Veitschegger, G. Bosi, A. Raffo, G. Vannini, “A GaN power amplifier for 100 VDC Bus in GPS L-band,” Power Amplifiers for Wireless and Radio Applications (PAWR), Phoenix, AZ, USA, Jan. 2017, pp. 100–103.
- F. Trevisan, A. Raffo, G. Bosi, V. Vadalà, G. Vannini, G. Formicone, J. Burger, J. Custer, “75-VDC GaN technology investigation from a degradation perspective,” 2017 Integrated Nonlinear Microwave and Millimetre-wave Circuits Workshop (INMMiC), Graz, Austria, Apr. 2017, pp. 1–4.
- G. Bosi, A. Raffo, G. Avolio, D. Schreurs, G. Vannini, “Impact of transistor model uncertainty on microwave load-pull simulations,” 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), Turin, Italy, May 2017, pp. 1–6.
- G. Bosi, A. Raffo, V. Vadalà, F. Trevisan, G. Formicone, J. Burger, J. Custer, G. Vannini, “Evaluation of high-voltage transistor reliability under nonlinear dynamic operation,” 12th European Microwave Integrated Circuits Conference (EuMIC), Nuremberg, Germany, Oct. 2017, pp. 248–251.
- E. Cipriani, P. Colantonio, F. Giannini. A. Raffo, V. Vadalà, G. Bosi, G. Vannini, “Extended operation of class-F power amplifiers using input waveform engineering,” 12th European Microwave Integrated Circuits Conference (EuMIC), Nuremberg, Germany, Oct. 2017, pp. 144–147.
- A. Petrocchi, A. Raffo, G. Bosi, G. Vannini, G. Avolio, K. Yavuz Kapusz, S. Lemey, H. Rogier, D. Schreurs, “An ultra-wideband setup to monitor antenna-impedance variations in low-cost IoT transmitters,” 2018 Integrated Nonlinear Microwave and Millimetre-wave Circuits Workshop (INMMiC), Brive-la-Gaillarde, France, Jul. 2018, pp. 1–3.
- K. Kikuchi, H. Yamamoto, N. Ui, K. Inoue, V. Vadalà, G. Bosi, A. Raffo, G. Vannini, “Comparison of GaN HEMT tecnology processes by large-signal low-frequency measurements,” 2018 Integrated Nonlinear Microwave and Millimetre-wave Circuits Workshop (INMMiC), Brive-la-Gaillarde, France, Jul. 2018, pp. 1–3.
- H. Yamamoto, K. Kikuchi, N. Ui, K. Inoue, V. Vadalà, G. Bosi, A. Raffo, G. Vannini, “Analysis of gate-voltage clipping behavior on class-F and inverse class-F amplifiers,” 2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), San Diego, CA, USA, Oct. 2018, pp. 44–47.
- V. Vadalà, A. Raffo, K. Kikuchi, H. Yamamoto, G. Bosi, K. Inoue, N. Ui, G. Vannini, “GaN HEMT model with enhanced accuracy under back-off operation,” 14th European Microwave Integrated Circuits Conference (EuMIC), Paris, France, Oct. 2019, pp. 37–40.
- G. Avolio, A. Raffo, M. Marchetti, G. Bosi, V. Vadalà, G. Vannini, “GaN FET load-pull data in circuit simulators: a comparative study,” 14th European Microwave Integrated Circuits Conference (EuMIC), Paris, France, Oct. 2019, pp. 80–83.
- G. Bosi, A. Raffo, V. Vadalà, G. Vannini, G. Avolio, and M. Marchetti, “Load-pull measurements oriented to harmonically-tuned power amplifier design,” International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits (INMMiC), Cardiff, UK, Jul. 2020, pp. 1-3.
- G. Bosi, V. Vadalà, R. Giofrè, A. Raffo, and G. Vannini, “Evaluation of microwave transistor degradation using low-frequency time-domain measurements,” 2021 XXXIVth General Assembly and Scientific Symposium of the International Union of Radio Science (URSI GASS), Rome, Italy, Aug. 2021, pp. 01-03.
- V. Vadalà, A. Raffo, A. Colzani, M. A. Fumagalli, G. Sivverini, G. Bosi, and G. Vannini, “Advanced modelling techniques enabling E-band power amplifier design for 5G backhauling,” 15th European Microwave Integrated Circuits Conference (EuMIC), Utrecht, Netherlands, Jan. 2021, pp. 161-164.
- G. Bosi, A. Raffo, R. Giofrè, V. Vadalà, G. Vannini, and E. Limiti, “Empowering GaN-Si HEMT nonlinear modelling for Doherty power amplifier design,” 15th European Microwave Integrated Circuits Conference (EuMIC), Utrecht, Netherlands, Jan. 2021, pp. 249-252.
- V. Vadalà, A. Raffo, G. Bosi, R. Giofrè, and G. Vannini, “Advanced measurement techniques for nonlinear modelling of GaN HEMTs: from L-band to mm-wave applications,” 15th International Conference on Advanced Technologies, Systems and Services in Telecommunications (TELSIKS), Nis, Serbia, Oct. 2021, pp. 63-69.
- V. Vadalà, G. Crupi, R. Giofrè, G. Bosi, A. Raffo, and G. Vannini, “mm-wave GaN HEMT technology: advances, experiments, and analysis,” Microwave Mediterranean Symposium (MMS), Pizzo Calabro, Italy, May 2022, pp. 1-6.
- V. Vadalà, A. Raffo, G. Bosi, A. Barsegyan, J.Custer, G. Formicone, J. Walker, and G. Vannini, “200W GaN PA design based on accurate multicell transistor modeling”, 2022 IEEE MTT-S International Microwave Symposium Digest, Denver, CO, USA, Jun. 2022, pp. 1–4.