Exploring Software Models for the Resilience Analysis of Deep Learning Accelerators: the NVDLA Case Study
Veronesi, A.; Dall'Occo, F.; Bertozzi, D.; Favalli, M.; Krstic, M.
dettagli >>
Atto di Convegno (Proceedings) |
Institute of Electrical and Electronics Engineers Inc.,
Proceedings - 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2022
pp: 142-147, Anno: 2022 |
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The challenge of classification confidence estimation in dynamically-adaptive neural networks
Dall'Occo, Francesco; Bueno-Crespo, Andrés; Abellán, José L.; Bertozzi, Davide; Favalli, Michele
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Atto di Convegno (Proceedings) |
Springer,
Embedded Computer Systems: Architectures, Modeling, and Simulation. 21st International Conference, SAMOS 2021, Virtual Event, July 4–8, 2021, Proceedings
Vol. 13227, No. 1, pp: 505-522, Anno: 2022 |
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A scalable bidimensional randomization scheme for tlc 3d nand flash memories
Favalli, M.; Zambelli, C.; Marelli, A.; Micheloni, R.; Olivo, P.
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Contributo in rivista (Pubblicazione in Rivista) |
MICROMACHINES
Vol. 12, No. 7, pp: 759-1-759-14, Anno: 2021 |
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A Boolean model for delay fault testing of emerging digital technologies based on ambipolar devices
Dalpasso, Marcello; Bertozzi, Davide; Favalli, Michele
dettagli >>
Atto di Convegno (Proceedings) |
Institute of Electrical and Electronics Engineers Inc.,
Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
Vol. 2018, No. 1, pp: 297-300, Anno: 2018 |
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A Built-In Self-Testing Framework for Asynchronous Bundled-Data NoC Switches Resilient to Delay Variations
Miorandi, Gabriele; Bertozzi, Davide; Favalli, Michele; Celin, Alberto
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Atto di Convegno (Proceedings) |
IEEE,
Tenth IEEE/ACM International Symposium on Networks-on-Chip (NOCS) 2016
pp: 113-120, Anno: 2016 |
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Boolean and Pseudo-Boolean Test Generation for Feedback Bridging Faults
Favalli, Michele; Dalpasso, Marcello
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Contributo in rivista (Pubblicazione in Rivista) |
IEEE TRANSACTIONS ON COMPUTERS
Vol. 65, No. 3, pp: 706-715, Anno: 2016 |
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Applications of Boolean Satisfiability to Verification and Testing of Switch-Level Circuits
Favalli, Michele; Marcello, Dalpasso
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Contributo in rivista (Pubblicazione in Rivista) |
JOURNAL OF ELECTRONIC TESTING
Vol. 30, No. 1, pp: 41-55, Anno: 2014 |
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Efficient testing of multi-output combinational cells in nano-complementary metal oxide semiconductor integrated circuits
Lorenzo, Valenti; Favalli, Michele; Marcello, Dalpasso
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Contributo in rivista (Pubblicazione in Rivista) |
IET COMPUTERS & DIGITAL TECHNIQUES
Vol. 8, No. 2, pp: 83-89, Anno: 2014 |
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A Complete Self-Testing and Self-Configuring NoC Infrastructure for Cost-Effective MPSoCs
Ghiribaldi, Alberto; Ludovici, Daniele; F., Trivino; Strano, Alessandro; J., Flich; J. L., Sanchez; F., Alfaro; Favalli, Michele; Bertozzi, Davide
dettagli >>
Contributo in rivista (Pubblicazione in Rivista) |
ACM TRANSACTIONS ON EMBEDDED COMPUTING SYSTEMS
Vol. 12, No. 4, pp: 106:1-106:29, Anno: 2013 |
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Power efficiency of switch architecture extensions for fault tolerant NoC design
Ghiribaldi, Alberto; Strano, Alessandro; Favalli, Michele; Bertozzi, Davide
dettagli >>
Atto di Convegno (Proceedings) |
IEEE,
Green Computing Conference (IGCC), 2012 International
pp: 1-6, Anno: 2012 |
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System-Level Infrastructure for Boot-time Testing and Configuration of
Networks-on-Chip with Programmable Routing Logic
Ghiribaldi, Alberto; Ludovici, Daniele; Favalli, Michele; Bertozzi, Davide
dettagli >>
Atto di Convegno (Proceedings) |
IEEE,
IEEE/IFIP 19th International Conference on VLSI and System-on-Chip (VLSI-SoC)
pp: 308-313, Anno: 2011 |
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Exploiting Network-on-Chip Structural Redundancy for A Cooperative and Scalable Built-In Self-Test Architecture
Strano, Alessandro; C. G., Requena; Ludovici, Daniele; M. E., Gomez; Favalli, Michele; Bertozzi, Davide
dettagli >>
Atto di Convegno (Proceedings) |
ACM/IEEE,
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
pp: 661-666, Anno: 2011 |
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A SAT Based Test Generation Method for Delay Fault Testing of Macro Based Circuits
Mele, Santino; Favalli, Michele
dettagli >>
Contributo in rivista (Pubblicazione in Rivista) |
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
Vol. 30, No. 4, pp: 631-635, Anno: 2011 |
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Testing Resistive Opens and Bridging
Faults Through Pulse Propagation
Favalli, Michele; C., Metra
dettagli >>
Contributo in rivista (Pubblicazione in Rivista) |
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
Vol. 28, No. 6, pp: 915-926, Anno: 2009 |
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How many test vectors we need to detect a bridging fault?
Favalli, Michele; M., Dalpasso
dettagli >>
Contributo in rivista (Pubblicazione in Rivista) |
JOURNAL OF ELECTRONIC TESTING
Vol. 25, No. 1, pp: 79-95, Anno: 2009 |
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High quality test vectors for bridging faults in the presence of IC's parameters variations
Favalli, Michele; Dalpasso, M.
Atto di Convegno (Proceedings) |
IEEE CS - press,
IEEE Symposium on Defect and Fault Tolerance in VLSI Systems
pp: 448-457, Anno: 2007 |
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Delay fault detection problems in circuits featuring a low combinational depth
Favalli, Michele
Atto di Convegno (Proceedings) |
IEEE CS - press,
IEEE Defect and Fault Tolerant Symposium in VLSI Systems
pp: 170-178, Anno: 2007 |
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Pulse propagation for the detection of small delay defects
Favalli, Michele
Atto di Convegno (Proceedings) |
IEEE - CS Press,
DATE'07 (Design Automation and TEst in Europe)
pp: 1-6, Anno: 2007 |
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Diversity analysis in the presence of delay faults affecting duplex systems
Favalli, Michele
dettagli >>
Contributo in rivista (Pubblicazione in Rivista) |
IEEE TRANSACTIONS ON COMPUTERS
Vol. 55, No. 3, pp: 348-352, Anno: 2006 |
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A fuzzy model for path delay fault detection
Favalli, Michele
dettagli >>
Contributo in rivista (Pubblicazione in Rivista) |
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
Vol. 13, No. 8, pp: 943-956, Anno: 2005 |
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