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A scalable bidimensional randomization scheme for tlc 3d nand flash memories
Favalli, M.; Zambelli, C.; Marelli, A.; Micheloni, R.; Olivo, P.     dettagli >>
MICROMACHINES
Vol. 12, No. 7, pp: 759-., Anno: 2021

Boolean and Pseudo-Boolean Test Generation for Feedback Bridging Faults
Favalli, Michele; Dalpasso, Marcello     dettagli >>
IEEE TRANSACTIONS ON COMPUTERS
Vol. 65, No. 3, pp: 706-715, Anno: 2016

Applications of Boolean Satisfiability to Verification and Testing of Switch-Level Circuits
Favalli, Michele; Marcello, Dalpasso     dettagli >>
JOURNAL OF ELECTRONIC TESTING
Vol. 30, No. 1, pp: 41-55, Anno: 2014

Efficient testing of multi-output combinational cells in nano-complementary metal oxide semiconductor integrated circuits
Lorenzo, Valenti; Favalli, Michele; Marcello, Dalpasso     dettagli >>
IET COMPUTERS & DIGITAL TECHNIQUES
Vol. 8, No. 2, pp: 83-89, Anno: 2014

A Complete Self-Testing and Self-Configuring NoC Infrastructure for Cost-Effective MPSoCs
Ghiribaldi, Alberto; Ludovici, Daniele; F., Trivino; Strano, Alessandro; J., Flich; J. L., Sanchez; F., Alfaro; Favalli, Michele; Bertozzi, Davide     dettagli >>
ACM TRANSACTIONS ON EMBEDDED COMPUTING SYSTEMS
Vol. 12, No. 4, pp: 106:1-106:29, Anno: 2013

A SAT Based Test Generation Method for Delay Fault Testing of Macro Based Circuits
Mele, Santino; Favalli, Michele     dettagli >>
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
Vol. 30, No. 4, pp: 631-635, Anno: 2011

Testing Resistive Opens and Bridging Faults Through Pulse Propagation
Favalli, Michele; C., Metra     dettagli >>
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
Vol. 28, No. 6, pp: 915-926, Anno: 2009

How many test vectors we need to detect a bridging fault?
Favalli, Michele; M., Dalpasso     dettagli >>
JOURNAL OF ELECTRONIC TESTING
Vol. 25, No. 1, pp: 79-95, Anno: 2009

Diversity analysis in the presence of delay faults affecting duplex systems
Favalli, Michele     dettagli >>
IEEE TRANSACTIONS ON COMPUTERS
Vol. 55, No. 1, pp: 348-352, Anno: 2006

A fuzzy model for path delay fault detection
Favalli, Michele     dettagli >>
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
Vol. 13, No. 8, pp: 943-956, Anno: 2005

TMR voting in the presence of crosstalk faults at the voter inputs
Favalli, Michele; Metra, C.     dettagli >>
IEEE TRANSACTIONS ON RELIABILITY
Vol. 53, No. 1, pp: 342-348, Anno: 2004

Concurrent detection of power supply noise
Metra, C; Schiano, L; Favalli, Michele     dettagli >>
IEEE TRANSACTIONS ON RELIABILITY
Vol. 52, No. 1, pp: 469-475, Anno: 2003

Scan flip-flops with on-line testing ability with respect to input delay and crosstalk faults
Metra, C; DI FRANCESCANTONIO, S; Favalli, Michele; Ricco, B.     dettagli >>
MICROELECTRONICS JOURNAL
Vol. 34, No. 1, pp: 23-29, Anno: 2003

Online testing approach for very deep-submicron ICs
Favalli, Michele; Metra, C.     dettagli >>
IEEE DESIGN & TEST OF COMPUTERS
Vol. 19, No. 1, pp: 16-23, Anno: 2002

Single Output Distribute Two-Rail Checker with Diagnosing Capabilities for Bus Based Self-Checking Architectures
Favalli, Michele; Metra, C.     dettagli >>
JOURNAL OF ELECTRONIC TESTING
Vol. 18, No. 1, pp: 273-283, Anno: 2002

On-Chip Clock Faults' Detector
Metra, C.; Favalli, Michele; Di Francescantonio, S.; Ricco', B.     dettagli >>
JOURNAL OF ELECTRONIC TESTING
Vol. 18, No. 1, pp: 555-564, Anno: 2002

Bridging fault modeling and simulation for deep submicron CMOS ICs
Favalli, Michele; Dalpasso, M.     dettagli >>
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
Vol. 21, No. 8, pp: 941-953, Anno: 2002

Bridging Faults in Pipelined Circuits Journal of Electronic Testing, Theory and Applications
Favalli, Michele; Metra, C.     dettagli >>
JOURNAL OF ELECTRONIC TESTING
Vol. 16, No. 6, pp: 290-296, Anno: 2000

Self-checking detection and diagnosis of transient, delay, and crosstalk faults affecting bus lines
Metra, C; Favalli, Michele; Ricco, B.     dettagli >>
IEEE TRANSACTIONS ON COMPUTERS
Vol. 49, No. 1, pp: 560-574, Anno: 2000

Enabling testability of fault-tolerant circuits by means of I-DDQ-checkable voters
Bogliolo, A; Favalli, Michele; Damiani, M.     dettagli >>
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
Vol. 8, No. 1, pp: 415-419, Anno: 2000

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