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150-nm GaN HEMT Degradation under Realistic Load-Line Operation
Raffo, A.; Vadala, V.; Bosi, G.; Giofre, R.; Vannini, G.     dettagli >>
Institute of Electrical and Electronics Engineers Inc., 2022 17th European Microwave Integrated Circuits Conference, EuMIC 2022
pp: 141-144, Anno: 2022

mm-Wave GaN HEMT Technology: Advances, Experiments, and Analysis
Vadala, V.; Crupi, G.; Giofre, R.; Bosi, G.; Raffo, A.; Vannini, G.     dettagli >>
IEEE Computer Society, Mediterranean Microwave Symposium
Vol. 2022-, No. 1, pp: 1-6, Anno: 2022

200-W GaN PA Design Based on Accurate Multicell Transistor Modeling
Vadala, V.; Raffo, A.; Bosi, G.; Barsegyan, A.; Custer, J.; Formicone, G.; Walker, J.; Vannini, G.     dettagli >>
Institute of Electrical and Electronics Engineers Inc., IEEE MTT-S International Microwave Symposium Digest
Vol. 2022-, No. 1, pp: 378-381, Anno: 2022

Empowering GaN-Si HEMT Nonlinear Modelling for Doherty Power Amplifier Design
Bosi, G.; Raffo, A.; Giofre, R.; Vadala, Valeria; Vannini, G.; Limiti, E.     dettagli >>
Institute of Electrical and Electronics Engineers Inc., EuMIC 2020 - 2020 15th European Microwave Integrated Circuits Conference
pp: 249-252, Anno: 2021

Advanced Measurement Techniques for Nonlinear Modelling of GaN HEMTs: From L-band to mm-Wave Applications
Vadalà, Valeria; Raffo, A.; Bosi, Gianni; Giofrè, Rocco; Vannini, Giorgio     dettagli >>
Institute of Electrical and Electronics Engineers Inc., 2021 15th International Conference on Advanced Technologies, Systems and Services in Telecommunications, TELSIKS 2021 - Proceedings
pp: 63-69, Anno: 2021

Evaluation of Microwave Transistor Degradation Using Low-Frequency Time-Domain Measurements
Bosi, G.; Vadala, V.; Giofre, R.; Raffo, A.; Vannini, G.     dettagli >>
Institute of Electrical and Electronics Engineers Inc., 2021 34th General Assembly and Scientific Symposium of the International Union of Radio Science, URSI GASS 2021
pp: 01-03, Anno: 2021

Advanced Modelling Techniques Enabling E-Band Power Amplifier Design for 5G Backhauling
Vadala, V.; Raffo, A.; Colzani, A.; Fumagalli, M. A.; Sivverini, G.; Bosi, G.; Vannini, G.     dettagli >>
Institute of Electrical and Electronics Engineers Inc., EuMIC 2020 - 2020 15th European Microwave Integrated Circuits Conference
pp: 161-164, Anno: 2021

Load-Pull Measurements Oriented to Harmonically-Tuned Power Amplifier Design
Bosi, Gianni; Raffo, Antonio; Vadalà, Valeria; Vannini, Giorgio; Avolio, Gustavo; Marchetti, Mauro; Giofre', Rocco; Colantonio, Paolo; Limiti, Ernesto     dettagli >>
Institute of Electrical and Electronics Engineers Inc., 2020 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits (INMMiC) - Proceedings
pp: 9160151-1-9160151-3, Anno: 2020

Nonlinear Characterization of GaN Transistors under Dynamic Bias Operation
Vadalà, Valeria; Vannini, G.     dettagli >>
Institute of Electrical and Electronics Engineers Inc., 2020 33rd General Assembly and Scientific Symposium of the International Union of Radio Science, URSI GASS 2020
pp: 9232254-1-9232254-3, Anno: 2020

GaN FET Load-Pull Data in Circuit Simulators: a Comparative Study
Avolio, G.; Raffo, A.; Marchetti, M.; Bosi, G.; Vadalà, V.; Vannini, G.     dettagli >>
Institute of Electrical and Electronics Engineers Inc., 2019 14th European Microwave Integrated Circuits Conference (EuMIC)
pp: 80-83, Anno: 2019

GaN HEMT Model with Enhanced Accuracy under Back-off Operation
Vadala', Valeria; Raffo, Antonio; Kikuchi, Ken; Yamamoto, Hiroshi; Bosi, Gianni; Inoue, Kazutaka; Ui, Norihiko; Vannini, Giorgio     dettagli >>
Institute of Electrical and Electronics Engineers Inc., 2019 14th European Microwave Integrated Circuits Conference (EuMIC)
pp: 37-40, Anno: 2019

An Ultra-Wideband Setup to Monitor Antenna-Impedance Variations in Low-Cost IoT Transmitters
Petrocchi, Alessandra; Raffo, A.; Bosi, G.; Vannini, G.; Yavuz Kapusuz, K.; Lemey, S.; Rogier, H.; Avolio, G.; Schreurs, D.     dettagli >>
Institute of Electrical and Electronics Engineers Inc., International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMIC 2018 - Proceedings
pp: 1-3, Anno: 2018

Analysis of Gate-Voltage Clipping Behavior on Class-F and Inverse Class-F Amplifiers
Yamamoto, Hiroshi; Kikuchi, Ken; Ui, Norihiko; Inoue, Kazutaka; Vadala, Valeria; Bosi, Gianni; Raffo, Antonio; Vannini, Giorgio     dettagli >>
Institute of Electrical and Electronics Engineers Inc., 2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2018
pp: 44-47, Anno: 2018

Comparison of GaN HEMT Technology Processes by Large-Signal Low-Frequency Measurements
Kikuchi, Ken; Yamamoto, Hiroshi; Ui, Norihiko; Inoue, Kazutaka; Vadala', Valeria; Bosi, Gianni; Raffo, Antonio; Vannini, Giorgio     dettagli >>
Institute of Electrical and Electronics Engineers Inc., International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMIC 2018 - Proceedings
pp: 8430002-1-8430002-3, Anno: 2018

A GaN power amplifier for 100 VDC bus in GPS L-band
Formicone, G.; Burger, J.; Custer, J.; Veitschegger, W.; Bosi, Gianni; Raffo, Antonio; Vannini, Giorgio     dettagli >>
Institute of Electrical and Electronics Engineers Inc., Proceedings of the 2017 IEEE Topical Conference on Power Amplifiers for Wireless and Radio Applications, PAWR 2017
pp: 100-103, Anno: 2017

An ultra-wideband sensing board for IoT
Petrocchi, A.; Raffo, A.; Avolio, G.; Lukasik, K.; Resca, D.; Vannini, G.; Lemey, S.; Caytan, O.; Agneessens, S.; Rogier, H.; Schreurs, D.     dettagli >>
Institute of Electrical and Electronics Engineers (IEEE), and Faculty of Electronic Engineering (FEE), University of Niš, Serbia, Advanced Technologies, Systems and Services in Telecommunications (TELSIKS), 2017 13th International Conference on
pp: 174-177, Anno: 2017

Thermal characterization of high-power GaN HEMTs up to 65 GHz
Petrocchi, Alessandra; Giovanni, Crupi; Vadala', Valeria; Gustavo, Avolio; Raffo, Antonio; Schreurs, Dominique M. M. -P.; Alina, Caddemi; Vannini, Giorgio     dettagli >>
Institute of Electrical and Electronics Engineers Inc., Advanced Technologies, Systems and Services in Telecommunications (TELSIKS), 2017 13th International Conference on
pp: 162-165, Anno: 2017

75-VDC GaN technology investigation from a degradation perspective
Trevisan, Francesco; Raffo, Antonio; Bosi, Gianni; Vadala', Valeria; Vannini, Giorgio; Formicone, Gabriele; Burger, Jeff; Custer, James     dettagli >>
Institute of Electrical and Electronics Engineers Inc., Proceedings of the 2017 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMiC 2017
pp: 1-4, Anno: 2017

Impact of transistor model uncertainty on microwave load-pull simulations
Bosi, Gianni; Raffo, Antonio; Vannini, Giorgio; Avolio, Gustavo; Schreurs, Dominique     dettagli >>
Institute of Electrical and Electronics Engineers Inc., I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings
pp: 1-6, Anno: 2017

Evaluation of high-voltage transistor reliability under nonlinear dynamic operation
Bosi, Gianni; Raffo, Antonio; Vadala', Valeria; Trevisan, Francesco; Formicone, Gabriele; Burger, Jeff; Custer, James; Vannini, Giorgio     dettagli >>
Institute of Electrical and Electronics Engineers Inc., Microwave Integrated Circuits Conference (EuMIC), 2017 12th European
pp: 248-251, Anno: 2017

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