|
High throughput edit distance computation on FPGA-based accelerators using HLS
Schifano, Sebastiano Fabio; Reggiani, Marco; Calore, Enrico; Micheloni, Rino; Marelli, Alessia; Zambelli, Cristian
dettagli >>
Contributo in rivista (Pubblicazione in Rivista) |
FUTURE GENERATION COMPUTER SYSTEMS
Vol. 164, No. 1, pp: 1-15, Anno: 2025 |
|
|
|
|
Comparing Short and Long-term Reliability of HfO2 and Al: HfO2 RRAM Devices
Baroni, A.; Perez, E.; Reddy, K. D. S.; Pechmann, S.; Wenger, C.; Ielmini, D.; Zambelli, C.
dettagli >>
Atto di Convegno (Proceedings) |
Institute of Electrical and Electronics Engineers Inc.,
IEEE International Integrated Reliability Workshop Final Report
pp: 1-6, Anno: 2024 |
|
|
|
|
A MQTT-based infrastructure to support Cooperative Online Learning Activities
Mendonca, H. S.; Zambelli, C.; Alves, J. C.
dettagli >>
Atto di Convegno (Proceedings) |
Institute of Electrical and Electronics Engineers Inc.,
2024 39th Conference on Design of Circuits and Integrated Systems, DCIS 2024
pp: 1-6, Anno: 2024 |
|
|
|
|
Analytical Model for Parasitic Resistances of Crossbar Arrays Suitable for Open-loop Programming Schemes Reliability Analysis
Rizzi, T.; Zanotti, T.; Lepri, N.; Perez, E.; Puglisi, F. M.; Ielmini, D.; Zambelli, C.
dettagli >>
Atto di Convegno (Proceedings) |
Institute of Electrical and Electronics Engineers Inc.,
IEEE International Integrated Reliability Workshop Final Report
pp: 1-6, Anno: 2024 |
|
|
|
|
Computational Storage for 3D NAND Flash Error Recovery Flow Prediction
Zambelli, C.; Miola, A.; Calore, E.; Micheloni, R.; Schifano, S. F.
dettagli >>
Atto di Convegno (Proceedings) |
Springer Science and Business Media Deutschland GmbH,
Lecture Notes in Electrical Engineering
Vol. 1113, No. 1, pp: 425-435, Anno: 2024 |
|
|
|
|
Improving 3D NAND Flash Memories Reliability: a Cross-Layer Perspective
Zambelli, C.; Micheloni, R.
dettagli >>
Atto di Convegno (Proceedings) |
IEEE,
Proceedings of the 2024 International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2024
Vol. 2024, No. 1, pp: 1-6, Anno: 2024 |
|
|
|
|
Digital In-Memory Computing to Accelerate Deep Learning Inference on the Edge
Perri, Stefania; Zambelli, Cristian; Ielmini, Daniele; Silvano, Cristina
dettagli >>
Atto di Convegno (Proceedings) |
IEEE,
Proceedings of the 2024 IEEE International Parallel and Distributed Processing Symposium Workshops, IPDPSW 2024
Vol. 2024, No. 1, pp: 130-133, Anno: 2024 |
|
|
|
|
Deep-learning survival analysis for patients with calcific aortic valve disease undergoing valve replacement
Mohammadyari, P.; Vieceli Dalla Sega, F.; Fortini, F.; Minghini, G.; Rizzo, P.; Cimaglia, P.; Mikus, E.; Tremoli, E.; Campo, G.; Calore, E.; Schifano, S. F.; Zambelli, C.
dettagli >>
Contributo in rivista (Pubblicazione in Rivista) |
SCIENTIFIC REPORTS
Vol. 14, No. 1, pp: 10902-1-10902-14, Anno: 2024 |
|
|
|
|
Exploring the NBTI Aging and PVT effects on RRAM-based FPGA Multiplexers Performance
Rizzi, T.; Baroni, A.; Bertozzi, D.; Wenger, C.; Ielmini, D.; Zambelli, C.
dettagli >>
Atto di Convegno (Proceedings) |
Institute of Electrical and Electronics Engineers Inc.,
IEEE International Integrated Reliability Workshop Final Report
pp: 1-5, Anno: 2023 |
|
|
|
|
Modeling 3D NAND Flash with Nonparametric Inference on Regression Coefficients for Reliable Solid-State Storage
Borghesi, Michela; Zambelli, Cristian; Micheloni, Rino; Bonnini, Stefano
dettagli >>
Contributo in rivista (Pubblicazione in Rivista) |
FUTURE INTERNET
Vol. 15, No. 10, pp: 319-1-319-13, Anno: 2023 |
|
|
|
|
Process-Voltage-Temperature Variations Assessment in Energy-Aware Resistive RAM-Based FPGAs
Rizzi, T.; Baroni, A.; Glukhov, A.; Bertozzi, D.; Wenger, C.; Ielmini, D.; Zambelli, C.
dettagli >>
Contributo in rivista (Pubblicazione in Rivista) |
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
Vol. 23, No. 3, pp: 328-336, Anno: 2023 |
|
|
|
|
Integrating FPGA Acceleration in the DNAssim Framework for Faster DNA-Based Data Storage Simulations
Marelli, A.; Chiozzi, T.; Battistini, N.; Zuolo, L.; Micheloni, R.; Zambelli, C.
dettagli >>
Contributo in rivista (Pubblicazione in Rivista) |
ELECTRONICS
Vol. 12, No. 12, pp: 2621-1-2621-19, Anno: 2023 |
|
|
|
|
An HPC Pipeline for Calcium Quantification of Aortic Root From Contrast-Enhanced CCT Scans
Minghini, Giada; Cavallo, Armando Ugo; Miola, Andrea; Sisini, Valentina; Calore, Enrico; Fortini, Francesca; Micheloni, Rino; Rizzo, Paola; Schifano, Sebastiano Fabio; Sega, Francesco Vieceli Dalla; Zambelli, Cristian
dettagli >>
Contributo in rivista (Pubblicazione in Rivista) |
IEEE ACCESS
Vol. 11, No. 1, pp: 101309-101319, Anno: 2023 |
|
|
|
|
On the Reliability of RRAM-Based Neural Networks
Aziza, H.; Zambelli, C.; Hamdioui, S.; Diware, S.; Bishnoi, R.; Gebregiorgis, A.
dettagli >>
Atto di Convegno (Proceedings) |
IEEE Computer Society,
IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC
pp: 1-8, Anno: 2023 |
|
|
|
|
Technology-Aware Drift Resilience Analysis of RRAM Crossbar Array Configurations
Reiser, D.; Reichenbach, M.; Rizzi, T.; Baroni, A.; Fritscher, M.; Wenger, C.; Zambelli, C.; Bertozzi, D.
dettagli >>
Atto di Convegno (Proceedings) |
IEEE,
21st IEEE Interregional NEWCAS Conference, NEWCAS 2023 - Proceedings
Vol. 2023, No. 1, pp: 1-5, Anno: 2023 |
|
|
|
|
Insights into device and material origins and physical mechanisms behind cross temperature in 3D NAND
Pesic, M.; Beltrando, B.; Rollo, T.; Zambelli, C.; Padovani, A.; Micheloni, R.; Maji, R.; Enman, L.; Saly, M.; Bae, Y. H.; Kim, J. B.; Yim, D. K.; Larcher, L.
dettagli >>
Atto di Convegno (Proceedings) |
IEEE,
Proceedings of the 2023 IEEE International Reliability Physics Symposium (IRPS)
Vol. 2023, No. 1, pp: 1-8, Anno: 2023 |
|
|
|
|
Machine Learning and Non-volatile Memories
Micheloni, R.; Zambelli, C.
dettagli >>
Curatela |
Springer,
Anno: 2022 |
|
|
|
|
Low Conductance State Drift Characterization and Mitigation in Resistive Switching Memories (RRAM) for Artificial Neural Networks
Baroni, A.; Glukhov, A.; Perez, E.; Wenger, C.; Ielmini, D.; Olivo, P.; Zambelli, C.
dettagli >>
Contributo in rivista (Pubblicazione in Rivista) |
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
Vol. 22, No. 3, pp: 340-347, Anno: 2022 |
|
|
|
|
Exploring Process-Voltage-Temperature Variations Impact on 4T1R Multiplexers for Energy-aware Resistive RAM-based FPGAs
Rizzi, T.; Baroni, A.; Glukhov, A.; Bertozzi, D.; Wenger, C.; Ielmini, D.; Zambelli, C.
dettagli >>
Atto di Convegno (Proceedings) |
Institute of Electrical and Electronics Engineers Inc.,
IEEE International Integrated Reliability Workshop Final Report
Vol. 2022-, No. 1, pp: 1-5, Anno: 2022 |
|
|
|
|
An energy-efficient in-memory computing architecture for survival data analysis based on resistive switching memories
Baroni, A.; Glukhov, A.; Perez, E.; Wenger, C.; Calore, E.; Schifano, S. F.; Olivo, P.; Ielmini, D.; Zambelli, C.
dettagli >>
Contributo in rivista (Pubblicazione in Rivista) |
FRONTIERS IN NEUROSCIENCE
Vol. 16, No. 1, pp: 932270-1-932270-16, Anno: 2022 |
|
|
|