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On the Extraction of Accurate Non-Quasi-Static Transistor Models for E-Band Amplifier Design: Learning From the Past
Vadalà, Valeria; Raffo, Antonio; Colzani, Alberto; Fumagalli, Matteo A.; Sivverini, Giuseppe; Bosi, Gianni; Vannini, Giorgio     dettagli >>

Contributo in rivista (Pubblicazione in Rivista)
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
Vol. --, No. 1, pp: 1-12, Anno: 2024

Accurate Modeling of GaN HEMTs Oriented to Analysis of Kink Effects in S22and h21: An Effective Machine Learning Approach
Zhu, Z.; Bosi, G.; Raffo, A.; Crupi, G.; Cai, J.     dettagli >>

Contributo in rivista (Pubblicazione in Rivista)
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY
Vol. 12, No. 1, pp: 201-210, Anno: 2024

Theoretical and Experimental Analysis of a CSWPL Behavioral Model for Microwave GaN Transistors Including DC Bias Voltages
Tang, X.; Raffo, A.; Donato, N.; Crupi, G.; Cai, J.     dettagli >>

Contributo in rivista (Pubblicazione in Rivista)
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
Vol. 43, No. 3, pp: 933-943, Anno: 2024

Harmonic Included CSWPL Model for Broadband PA Design Based on GaN HEMTs
Tang, X.; Raffo, A.; Crupi, G.; Cai, J.     dettagli >>

Contributo in rivista (Pubblicazione in Rivista)
IEEE TRANSACTIONS ON ELECTRON DEVICES
Vol. 71, No. 3, pp: 1387-1395, Anno: 2024

A New Calibration Technique of Electromagnetic Simulators for Accurate Analyses of Microwave Components on Epitaxial Wafers
Kikuchi, K; Raffo, A; Vadalà, V; Bosi, G; Vannini, G; Yamamoto, H     dettagli >>

Contributo in rivista (Pubblicazione in Rivista)
IEEE ACCESS
Vol. 12, No. 1, pp: 72721-72729, Anno: 2024

A Thorough Evaluation of GaN HEMT Degradation under Realistic Power Amplifier Operation
Bosi, G.; Raffo, A.; Vadala, V.; Giofre, R.; Crupi, G.; Vannini, G.     dettagli >>

Contributo in rivista (Pubblicazione in Rivista)
ELECTRONICS
Vol. 12, No. 13, pp: 2939-2956, Anno: 2023

Experimental Validation of Class F Waveform Engineering in Class C Biasing Condition
Manni, F.; Giofre, R.; Giannini, F.; Vadala, V.; Bosi, G.; Raffo, A.; Vannini, G.; Colantonio, P.     dettagli >>

Atto di Convegno (Proceedings)
Institute of Electrical and Electronics Engineers Inc., 2023 18th European Microwave Integrated Circuits Conference, EuMIC 2023
pp: 402-405, Anno: 2023

Experimental Investigation on Class-E and Class-F-1 Operation under Square-Waveform Excitation
Bosi, G.; Raffo, A.; Giofre, R.; Vadala, V.; Crupi, G.; Colantonio, P.; Vannini, G.     dettagli >>

Atto di Convegno (Proceedings)
Institute of Electrical and Electronics Engineers Inc., 2023 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMiC 2023 - Proceedings
pp: 1-4, Anno: 2023

Optimal Coupling for the Reduction of bimodality in 850nm-VCSEL-based Radio-over-G.652-Fiber
Nanni, J.; Saderi, G.; Bellanca, G.; Bosi, G.; Raffo, A.; Vadala, V.; Debernardi, P.; Polleux, J. -L.; Billabert, A. -L.; Esfahani, M. N.; Tartarini, G.     dettagli >>

Atto di Convegno (Proceedings)
Institute of Electrical and Electronics Engineers Inc., 2023 International Topical Meeting on Microwave Photonics, MWP 2023 - Proceedings
pp: 1-4, Anno: 2023

A Comprehensive Overview of the Temperature-Dependent Modeling of the High-Power GaN HEMT Technology Using mm-Wave Scattering Parameter Measurements (Invited Paper)
Crupi, G.; Latino, M.; Gugliandolo, G.; Marinkovic, Z.; Cai, J.; Bosi, G.; Raffo, A.; Fazio, E.; Donato, N.     dettagli >>

Contributo in rivista (Pubblicazione in Rivista)
ELECTRONICS
Vol. 12, No. 8, pp: 1771-1-1771-15, Anno: 2023

Robustness Validation of a mm-Wave Model based on GRU Neural Networks for a GaN Power HEMT
Marinkovic, Z.; Cai, J.; Gugliandolo, G.; Latino, M.; Fazio, E.; Bosi, G.; Raffo, A.; Crupi, G.; Donato, N.     dettagli >>

Atto di Convegno (Proceedings)
Institute of Electrical and Electronics Engineers Inc., 2023 IEEE 33rd International Conference on Microelectronics, MIEL 2023
pp: 1-4, Anno: 2023

GaN HEMT Current-Gain Peak: An Insight into the Effects of the Bias Condition
Gugliandolo, Giovanni; Crupi, Giovanni; Marinković, Zlatica; Vadalà, Valeria; Raffo, Antonio; Donato, Nicola; Vannini, Giorgio     dettagli >>

Atto di Convegno (Proceedings)
Institute of Electrical and Electronics Engineers Inc., 2023 International Conference on Advanced Technologies, Systems and Services in Telecommunications, TELSIKS 2023
pp: 66-69, Anno: 2023

A Systematic and Numerical Methodology for GaN HEMT Current-Gain Peak Analysis Using the Complex Lorentzian Function
Gugliandolo, G; Crupi, G; Vadala, V; Raffo, A; Donato, N; Vannini, G     dettagli >>

Contributo in rivista (Pubblicazione in Rivista)
IEEE MICROWAVE AND WIRELESS TECHNOLOGY LETTERS
Vol. 33, No. 7, pp: 1007-1010, Anno: 2023

GaN HEMT Small-Signal Modeling Using an Optimization Strategy Based on Gated Recurrent Unit Networks
Cai, Jialin; Gugliandolo, Giovanni; Marinković, Zlatica; Latino, Mariangela; Fazio, Enza; Bosi, Gianni; Raffo, Antonio; Crupi, Giovanni; Donato, Nicola     dettagli >>

Atto di Convegno (Proceedings)
Institute of Electrical and Electronics Engineers Inc., 2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)
pp: 422-426, Anno: 2023

Active Balun Design for Next-Generation Telecom Satellite Frequency Converters
Resca, D.; Bosi, G.; Biondi, A.; Cariani, L.; Vadala, V.; Scappaviva, F.; Raffo, A.; Vannini, G.     dettagli >>

Contributo in rivista (Pubblicazione in Rivista)
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS
Vol. 33, No. 2, pp: 165-168, Anno: 2023

An Unconventional Measurement Technique for the Nonlinear Characterization of mm-Wave GaN HEMT
Vadalà, Valeria; Raffo, Antonio; Bosi, Gianni; Giofrè, Rocco; Colantonio, Paolo; Vannini, Giorgio     dettagli >>

Atto di Convegno (Proceedings)
IEEE, 2023 18th European Microwave Integrated Circuits Conference (EuMIC)
pp: 394-397, Anno: 2023

150-nm GaN HEMT Degradation under Realistic Load-Line Operation
Raffo, A.; Vadala, V.; Bosi, G.; Giofre, R.; Vannini, G.     dettagli >>

Atto di Convegno (Proceedings)
Institute of Electrical and Electronics Engineers Inc., 2022 17th European Microwave Integrated Circuits Conference, EuMIC 2022
pp: 141-144, Anno: 2022

Equivalent-circuit extraction for gallium nitride electron devices: Direct versus optimization-empowered approaches
Jarndal, A.; Crupi, G.; Alim, M. A.; Vadala, V.; Raffo, A.; Vannini, G.     dettagli >>

Contributo in rivista (Pubblicazione in Rivista)
INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS
Vol. 35, No. 5, pp: e3008-1-e3008-11, Anno: 2022

mm-Wave GaN HEMT Technology: Advances, Experiments, and Analysis
Vadala, V.; Crupi, G.; Giofre, R.; Bosi, G.; Raffo, A.; Vannini, G.     dettagli >>

Atto di Convegno (Proceedings)
IEEE Computer Society, Mediterranean Microwave Symposium
Vol. 2022-, No. 1, pp: 420-425, Anno: 2022

Analysis of Efficiency-Limiting Factors Resulting from Transistor Current Source on Class-F and Inverse Class-F Power Amplifiers
Yamamoto, H.; Kikuchi, K.; Vadala, V.; Bosi, G.; Raffo, A.; Vannini, G.     dettagli >>

Contributo in rivista (Pubblicazione in Rivista)
IEICE TRANSACTIONS ON ELECTRONICS
Vol. E105C, No. 10, pp: 449-456, Anno: 2022

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